Of photonic crystals with different lattice constants 不同晶格常数光子晶体构成的
The lattice constant determination of metals - method of x - ray diffractometer 金属点阵常数的测定方法x射线衍射仪法
An accurate measurement of lattice constants of the p films were carried out by gaxrd 晶格膨胀,其原因可能在于原子半径小的碳占据了p 。
The lattice constants of the films increase and the diffraction peaks shift to low direction 薄膜的电学性质发生明显变化,面电阻率降至106
Therefore , we deduce that the lattice constant of the covalent nanocrystallites will increase with the decreasing of the grain size 由此我们推断共价结构纳米微粒的晶格常数随着晶粒线度的减小而增大。
Using the single crystal x - ray diffraction ( scxrd ) method , we got the lattice constant , and found it was more than that of silicon 利用单晶x - ray衍射( scxrd )对czsige单晶的晶胞进行了测试,发现晶胞参数发生了明显的变化。
The change of lattice constants and the cell volume expansion are calculated , which make an important contribution to the increase of the magnetocrystalline anisotropy 计算了引起材料磁晶各向异性大大增加的点阵常数的变化和体积膨胀量。
The factors affecting the in - plane thermal conductivity of thin films discussed include the mass of particles , the well depth , and the lattice constant , etc 从粒子质量、势阱深度、晶格常数的变化等方面讨论了其对薄膜两种材料的切向导热系数的影响。
By controlling the parameters of deposition , fabricated films are single phase and grown well on two kinds of substrates with different lattice constants 继而论及薄膜生长方式,具有不同失配度的衬底对薄膜产生的不同应力类型,光刻和镀电极的简略步骤。
It was found that the lattice constant increased with the decreasing grain size of some nanocrystallites , while some changed inversely 在关于纳米微晶的研究中,人们发现有的材料的晶格常数随着晶粒线度的减小而增大,有的材料的晶格常数随着晶粒线度的减小而减小。